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	1.	Analysis of thin plates with holes by using exact geometrical representation within XFEM. [electronic resource] by Perumal, Logah Tso, C P Leng, Lim Thong Producer: 20160525 In: Journal of advanced research vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Image noise variance estimation using the mixed Lagrange time-delay autoregressive model. [electronic resource] by Sim, K-S Tso, C-P Law, K-K Producer: 20080701 In: Microscopy research and technique vol. 71 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Noise variance estimation using image noise cross-correlation model on SEM images. [electronic resource] by Sim, K S Nia, M E Tso, C P Producer: 20131205 In: Scanning vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Canny optimization technique for electron microscope image colourization. [electronic resource] by Sim, K S Tso, C P Ting, H Y Producer: 20081217 In: Journal of microscopy vol. 232 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Mixed lagrange time delay estimation autoregressive Wiener filter application for real-time SEM image enhancement. [electronic resource] by Sim, K S Law, K K Tso, C P Producer: 20080107 In: Microscopy research and technique vol. 70 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Signal-to-noise ratio estimation using adaptive tuning on the piecewise cubic Hermite interpolation model for images. [electronic resource] by Sim, K S Yeap, Z X Tso, C P Producer: 20180328 In: Scanning vol. 38 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Image noise cross-correlation for signal-to-noise ratio estimation in scanning electron microscope images. [electronic resource] by Sim, K S Nia, M E Tso, C P Producer: 20110802 In: Scanning vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Localization of burn mark under an abnormal topography on MOSFET chip surface using liquid crystal and emission microscopy tools. [electronic resource] by Lau, C K Sim, K S Tso, C P Producer: 20110718 In: Scanning vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Gaussian-Taylor signal-to-noise ratio estimation for scanning electron microscope images. [electronic resource] by Sim, K S Lee, J K Lai, M A Tso, C P Producer: 20091117 In: Journal of microscopy vol. 236 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Real-time image quality assessment with mixed Lagrange time delay estimation autoregressive (MLTDEAR) model. [electronic resource] by Sim, K S Tso, C P Tan, Y Y Lim, W K Producer: 20080404 In: Journal of microscopy vol. 226 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Improvement to the scanning electron microscope image adaptive Canny optimization colorization by pseudo-mapping. [electronic resource] by Lo, T Y Sim, K S Tso, C P Nia, M E Producer: 20150521 In: Scanning vol. 36 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Signal-to-noise ratio estimation on SEM images using cubic spline interpolation with Savitzky-Golay smoothing. [electronic resource] by Sim, K S Kiani, M A Nia, M E Tso, C P Producer: 20140716 In: Journal of microscopy vol. 253 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Fluid flow characteristics within an oscillating lower spherical surface and a stationary concentric upper surface for application to the artificial hip joint. [electronic resource] by Tso, C P Hor, C H Chen, G M Kok, C K Publication details: Heliyon Dec 2018 In: Heliyon vol. 4 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Single image signal-to-noise ratio estimation for magnetic resonance images. [electronic resource] by Sim, K S Lai, M A Tso, C P Teo, C C Producer: 20110322 In: Journal of medical systems vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Lagrange time delay estimation for scanning electron microscope image magnification. [electronic resource] by Sim, K-S Thong, L W Ting, H Y Tso, C P Producer: 20100317 In: Journal of microscopy vol. 237 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	Performance of new signal-to-noise ratio estimation for SEM images based on single image noise cross-correlation. [electronic resource] by Sim, K S Nia, M E Tso, C P Lim, W K Producer: 20130312 In: Journal of microscopy vol. 248 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	Improvement to the scanning electron microscope image colorization by adaptive tuning. [electronic resource] by Sim, K S Ting, H Y Lai, M A Tso, C P Producer: 20090716 In: Journal of microscopy vol. 234 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	Signal-to-noise ratio enhancement on SEM images using a cubic spline interpolation with Savitzky-Golay filters and weighted least squares error. [electronic resource] by Kiani, M A Sim, K S Nia, M E Tso, C P Producer: 20150618 In: Journal of microscopy vol. 258 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	19.	Reducing charging effects in scanning electron microscope images by Rayleigh contrast stretching method (RCS). [electronic resource] by Wan Ismail, W Z Sim, K S Tso, C P Ting, H Y Producer: 20111222 In: Scanning vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	20.	A contrast stretching bilateral closing top-hat Otsu threshold technique for crack detection in images. [electronic resource] by Sim, K S Kho, Y Y Tso, C P Nia, M E Ting, H Y Producer: 20130927 In: Scanning vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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Your search returned 22 results.