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	1.	Origin of particles during reactive sputtering of oxides using planar and cylindrical magnetrons. [electronic resource] by Rademacher, Daniel Fritz, Benjamin Vergöhl, Michael Producer: 20120718 In: Applied optics vol. 51 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	In situ thickness determination of multilayered structures using single wavelength ellipsometry and reverse engineering. [electronic resource] by Rademacher, Daniel Vergöhl, Michael Richter, Uwe Producer: 20110822 In: Applied optics vol. 50 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Optical properties of silicon titanium oxide mixtures prepared by metallic mode reactive sputtering. [electronic resource] by Rademacher, Daniel Bräuer, Günter Fritz, Benjamin Vergöhl, Michael Producer: 20131104 In: Applied optics vol. 51 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Properties of reactive sputtered alumina-silica mixtures. [electronic resource] by Bruns, Stefan Rademacher, Daniel Vergöhl, Michael Weiss, Peter Producer: 20150521 In: Applied optics vol. 53 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Measurement of the translational and rotational Brownian motion of individual particles in a rarefied gas. [electronic resource] by Blum, Jürgen Bruns, Stefan Rademacher, Daniel Voss, Annika Willenberg, Björn Krause, Maya Producer: 20080819 In: Physical review letters vol. 97 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)