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	1.	Structural and optical characterization of pure Si-rich nitride thin films. [electronic resource] by Debieu, Olivier Nalini, Ramesh Pratibha Cardin, Julien Portier, Xavier Perrière, Jacques Gourbilleau, Fabrice Producer: 20130206 In: Nanoscale research letters vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	SiOx/SiNy multilayers for photovoltaic and photonic applications. [electronic resource] by Nalini, Ramesh Pratibha Khomenkova, Larysa Debieu, Olivier Cardin, Julien Dufour, Christian Carrada, Marzia Gourbilleau, Fabrice Producer: 20121002 In: Nanoscale research letters vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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