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Results of search for 'au:"Menyhárd, M"'
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Authors
Baradács, E
Barna, A
Cserháti, C
Erdélyi, Z
Gurban, S
Gurbán, S
Jablonski, A
Kerner, Z
Kotis, L
Langer, G A
Menyhard, M
Menyhárd, M
Nemeth, A
Panjan, P
Parditka, B
Peter, L
Petrik, P
Racz, A S
Sulyok, A
Toth, A L
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Topics
Computer Simulation
Electrons
Microscopy, Electron, Scanning
Monte Carlo Method
methods
Languages
English
Your search returned 5 results.
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1.
Design of Corrosion Resistive SiC Nanolayers.
[electronic resource]
by
Racz, A S
Menyhard, M
Producer:
20180731
In:
ACS applied materials & interfaces
vol. 10
Online resources:
Available from publisher's website
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2.
Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast.
[electronic resource]
by
Sulyok, A
Toth, A L
Zommer, L
Menyhard, M
Jablonski, A
Producer:
20130815
In:
Ultramicroscopy
vol. 124
Online resources:
Available from publisher's website
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3.
Ion mixing at 20 keV: a comparison of the effects of Ga+, Ar+ and CF4+ ion irradiation.
[electronic resource]
by
Barna, A
Gurban, S
Kotis, L
Toth, A L
Menyhard, M
Producer:
20090210
In:
Ultramicroscopy
vol. 109
Online resources:
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4.
Corrosion Resistance of Nanosized Silicon Carbide-Rich Composite Coatings Produced by Noble Gas Ion Mixing.
[electronic resource]
by
Racz, A S
Kerner, Z
Nemeth, A
Panjan, P
Peter, L
Sulyok, A
Vertesy, G
Zolnai, Z
Menyhard, M
Producer:
20180724
In:
ACS applied materials & interfaces
vol. 9
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5.
Electron irradiation induced amorphous SiO
[electronic resource]
by
Gurbán, S
Petrik, P
Serényi, M
Sulyok, A
Menyhárd, M
Baradács, E
Parditka, B
Cserháti, C
Langer, G A
Erdélyi, Z
Producer:
20181031
In:
Scientific reports
vol. 8
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