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Results of search for 'au:"Cassidy, D T"', page 1 of 2
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Authors
Aitken, G J
Bonnell, L J
Bruce, D M
Cassidy, D T
Hamp, M J
Hill, K O
Johnson, D C
Lowes, T D
Menzies, R T
Peters, F H
Reid, J
Ventrudo, B F
Woodworth, S C
Yang, J
Zhu, X
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Microscopy, Electron
Photochemistry
methods
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English
Your search returned 23 results.
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1.
Trace gas detection using 1.3-microm InGaAsP diode laser transmitter modules.
[electronic resource]
by
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 27
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2.
Comparison of rate-equation and Fabry-Perot approaches to modeling a diode laser.
[electronic resource]
by
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 22
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3.
Influence on the steady-state oscillation spectrum of a diode laser for feedback of light interacting coherently and incoherently with the field established in the laser cavity.
[electronic resource]
by
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 23
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4.
Differential quantum efficiency of a homogeneously broadened injection laser.
[electronic resource]
by
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 23
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5.
High-sensitivity detection of trace gases using sweep integration and tunable diode lasers.
[electronic resource]
by
Cassidy, D T
Reid, J
Producer:
20121002
In:
Applied optics
vol. 21
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6.
Electronic subtracter for trace-gas detection with InGaAsP diode lasers.
[electronic resource]
by
Zhu, X
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 34
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7.
Atmospheric pressure monitoring of trace gases using tunable diode lasers.
[electronic resource]
by
Cassidy, D T
Reid, J
Producer:
20121002
In:
Applied optics
vol. 21
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8.
Technique for mapping the spectral uniformity of luminescent semiconducting material.
[electronic resource]
by
Yang, J
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 34
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9.
Liquid detection with InGaAsP semiconductor lasers having multiple short external cavities.
[electronic resource]
by
Zhu, X
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 35
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10.
Field distribution of a 1-D imaging element.
[electronic resource]
by
Aitken, G J
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 20
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11.
Spatially and polarization resolved electroluminescence of 1.3-microm InGaAsP semiconductor diode lasers.
[electronic resource]
by
Peters, F H
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 28
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12.
Interference fringes in the far field of short-external-cavity InGaAsP diode lasers: a method for longitudinal mode control.
[electronic resource]
by
Ventrudo, B F
Cassidy, D T
Producer:
20130704
In:
Applied optics
vol. 32
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13.
Alignment tolerances of short-external-cavity InGaAsP diode lasers for use as tunable single-mode sources.
[electronic resource]
by
Bonnell, L J
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 28
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14.
Strain and scattering related spectral output of 1.3microm InGaAsP semiconductor diode lasers.
[electronic resource]
by
Peters, F H
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 30
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15.
Optical processor for search and rescue.
[electronic resource]
by
Aitken, G J
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 19
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16.
InP sample preparation for the TEM by photochemical etching, ion milling, and chemical thinning.
[electronic resource]
by
Lowes, T D
Cassidy, D T
Producer:
19930201
In:
Microscopy research and technique
vol. 23
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17.
Operating characteristics of a tunable diode laser absorption spectrometer using short-external-cavity and DFB laser diodes.
[electronic resource]
by
Ventrudo, B F
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 29
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18.
Trace gas detection with short-external-cavity InGaAsP diode laser transmitter modules operating at 1.58 microm.
[electronic resource]
by
Cassidy, D T
Bonnell, L J
Producer:
20121002
In:
Applied optics
vol. 27
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19.
Detection of oxygen using short external cavity GaAs semiconductor diode lasers.
[electronic resource]
by
Bruce, D M
Cassidy, D T
Producer:
20121002
In:
Applied optics
vol. 29
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20.
Linewidth measurements of tunable diode lasers using heterodyne and etalon techniques.
[electronic resource]
by
Reid, J
Cassidy, D T
Menzies, R T
Producer:
20100520
In:
Applied optics
vol. 21
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