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	1.	Annular Focused Electron/Ion Beams for Combining High Spatial Resolution with High Probe Current. [electronic resource] by Khursheed, Anjam Ang, Wei Kean Producer: 20180719 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	A high-brightness large-diameter graphene coated point cathode field emission electron source. [electronic resource] by Shao, Xiuyuan Srinivasan, Avinash Ang, Wei Kean Khursheed, Anjam Producer: 20181120 In: Nature communications vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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