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Results of search for 'au:"Adolph, Daniel"'
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Authors
Adolph, Daniel
Furch, Federico J
Hoff, Dominik
Kellner, Philipp
Max Sayler, A
Möller, Max
Paulus, Gerhard G
Rühle, Klaus
Sayler, A Max
Schulz, Claus Peter
Skruszewicz, Slawomir
Vrakking, Marc J J
Witting, Tobias
Wustelt, Philipp
Würzler, Daniel
Zhang, Yinyu
Zille, Danilo
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1.
Single-shot, real-time carrier-envelope phase measurement and tagging based on stereographic above-threshold ionization at short-wave infrared wavelengths.
[electronic resource]
by
Zhang, Yinyu
Kellner, Philipp
Adolph, Daniel
Zille, Danilo
Wustelt, Philipp
Würzler, Daniel
Skruszewicz, Slawomir
Möller, Max
Max Sayler, A
Paulus, Gerhard G
Producer:
20180205
In:
Optics letters
vol. 42
Online resources:
Available from publisher's website
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No items available.
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2.
Continuous every-single-shot carrier-envelope phase measurement and control at 100 kHz.
[electronic resource]
by
Hoff, Dominik
Furch, Federico J
Witting, Tobias
Rühle, Klaus
Adolph, Daniel
Sayler, A Max
Vrakking, Marc J J
Paulus, Gerhard G
Schulz, Claus Peter
Producer:
20180817
In:
Optics letters
vol. 43
Online resources:
Available from publisher's website
Availability:
No items available.
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(remove)