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	1.	Analytic determination of n, k and d of two-dimensional materials by ellipsometry and reflectivity. [electronic resource] by Adamson, Peep Producer: 20150521 In: Applied optics vol. 53 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials. [electronic resource] by Adamson, Peep Producer: 20120210 In: Applied optics vol. 50 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry. [electronic resource] by Adamson, Peep Producer: 20100105 In: Applied optics vol. 48 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Reflectance calculations of anisotropic dielectric constants of graphene-like two-dimensional materials. [electronic resource] by Adamson, Peep Producer: 20180205 In: Applied optics vol. 56 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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