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5498.
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5499.
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Diffraction phase microscopy: monitoring nanoscale dynamics in materials science [invited]. [electronic resource] by
- Edwards, Chris
- Zhou, Renjie
- Hwang, Suk-Won
- McKeown, Steven J
- Wang, Kaiyuan
- Bhaduri, Basanta
- Ganti, Raman
- Yunker, Peter J
- Yodh, Arjun G
- Rogers, John A
- Goddard, Lynford L
- Popescu, Gabriel
Producer: 20150730
In:
Applied optics vol. 53
Availability: No items available.
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5500.
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