Results
|
4401.
|
|
|
4402.
|
|
|
4403.
|
|
|
4404.
|
|
|
4405.
|
|
|
4406.
|
|
|
4407.
|
|
|
4408.
|
Silicon nanowire based radio-frequency spectrum analyzer. [electronic resource] by
- Corcoran, Bill
- Vo, Trung D
- Pelusi, Mark D
- Monat, Christelle
- Xu, Dan-Xia
- Densmore, Adam
- Ma, Rubin
- Janz, Siegfried
- Moss, David J
- Eggleton, Benjamin J
Producer: 20110222
In:
Optics express vol. 18
Availability: No items available.
|
|
4409.
|
|
|
4410.
|
[In-depth assessment of work-related stress in a major company undergoing restructuring]. [electronic resource] by
- Magrini, Andrea
- Pelagalli, Maria Felicia
- Pietroiusti, Antonio
- Livigni, Lucilla
- Guidi, Stefano
- Moscatelli, Maurizia
- Mascioli, Marco
- D'Orsi, Fulvio
- Zolla, Antonella
- Bagnara, Sebastiano
Producer: 20151020
In:
La Medicina del lavoro vol. 106
Availability: No items available.
|
|
4411.
|
|
|
4412.
|
|
|
4413.
|
|
|
4414.
|
|
|
4415.
|
|
|
4416.
|
|
|
4417.
|
|
|
4418.
|
|
|
4419.
|
|
|
4420.
|
|