Results
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4101.
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4102.
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4103.
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4104.
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4105.
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4106.
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4107.
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4108.
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4109.
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4110.
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4111.
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Absolute calibration of image plates for electrons at energy between 100 keV and 4 MeV. [electronic resource] by
- Chen, Hui
- Back, Norman L
- Bartal, Teresa
- Beg, F N
- Eder, David C
- Link, Anthony J
- MacPhee, Andrew G
- Ping, Yuan
- Song, Peter M
- Throop, Alan
- Van Woerkom, Linn
Producer: 20080610
In:
The Review of scientific instruments vol. 79
Availability: No items available.
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4112.
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4113.
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4114.
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4115.
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4116.
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Loss budget of a setup for measuring mechanical dissipations of silicon wafers between 300 and 4 K. [electronic resource] by
- Zendri, J P
- Bignotto, M
- Bonaldi, M
- Cerdonio, M
- Conti, L
- Ferrario, L
- Liguori, N
- Maraner, A
- Serra, E
- Taffarello, L
Producer: 20080610
In:
The Review of scientific instruments vol. 79
Availability: No items available.
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4117.
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4118.
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4119.
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4120.
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