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Exploiting micro-scale structural and chemical observations in real time for understanding chemical conversion: LEEM/PEEM studies over CeO [electronic resource] by
- Duchoň, Tomáš
- Hackl, Johanna
- Höcker, Jan
- Veltruská, Kateřina
- Matolín, Vladimír
- Falta, Jens
- Cramm, Stefan
- Nemšák, Slavomír
- Schneider, Claus M
- Flege, Jan Ingo
- Senanayake, Sanjaya D
Producer: 20180806
In:
Ultramicroscopy vol. 183
Availability: No items available.
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