Results
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2741.
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2742.
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2743.
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2744.
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2745.
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2746.
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2747.
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High precision tilt stage as a key element to a universal test mirror for characterization and calibration of slope measuring instruments. [electronic resource] by
- Yashchuk, Valeriy V
- Artemiev, Nikolay A
- Centers, Gary
- Chaubard, Arthur
- Geckeler, Ralf D
- Lacey, Ian
- Marth, Harry
- McKinney, Wayne R
- Noll, Tino
- Siewert, Frank
- Winter, Mathias
- Zeschke, Thomas
Producer: 20170424
In:
The Review of scientific instruments vol. 87
Availability: No items available.
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2748.
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2749.
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At-wavelength metrology facility for soft X-ray reflection optics. [electronic resource] by
- Sokolov, A
- Bischoff, P
- Eggenstein, F
- Erko, A
- Gaupp, A
- Künstner, S
- Mast, M
- Schmidt, J-S
- Senf, F
- Siewert, F
- Zeschke, Th
- Schäfers, F
Producer: 20170424
In:
The Review of scientific instruments vol. 87
Availability: No items available.
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2750.
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2751.
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2752.
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2753.
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2754.
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2755.
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2756.
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2757.
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2758.
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2759.
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2760.
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A cryogenic rotation stage with a large clear aperture for the half-wave plates in the Spider instrument. [electronic resource] by
- Bryan, Sean
- Ade, Peter
- Amiri, Mandana
- Benton, Steven
- Bihary, Richard
- Bock, James
- Bond, J Richard
- Chiang, H Cynthia
- Contaldi, Carlo
- Crill, Brendan
- Dore, Olivier
- Elder, Benjamin
- Filippini, Jeffrey
- Fraisse, Aurelien
- Gambrel, Anne
- Gandilo, Natalie
- Gudmundsson, Jon
- Hasselfield, Matthew
- Halpern, Mark
- Hilton, Gene
- Holmes, Warren
- Hristov, Viktor
- Irwin, Kent
- Jones, William
- Kermish, Zigmund
- Lawrie, Craig
- MacTavish, Carrie
- Mason, Peter
- Megerian, Krikor
- Moncelsi, Lorenzo
- Montroy, Thomas
- Morford, Tracy
- Nagy, Johanna
- Netterfield, C Barth
- Padilla, Ivan
- Rahlin, Alexandra S
- Reintsema, Carl
- Riley, Daniel C
- Ruhl, John
- Runyan, Marcus
- Saliwanchik, Benjamin
- Shariff, Jamil
- Soler, Juan
- Trangsrud, Amy
- Tucker, Carole
- Tucker, Rebecca
- Turner, Anthony
- Wen, Shyang
- Wiebe, Donald
- Young, Edward
Producer: 20160526
In:
The Review of scientific instruments vol. 87
Availability: No items available.
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