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Electrical isolation of dislocations in Ge layers on Si(001) substrates through CMOS-compatible suspended structures. [electronic resource] by
- Shah, Vishal Ajit
- Myronov, Maksym
- Wongwanitwatana, Chalermwat
- Bawden, Lewis
- Prest, Martin J
- Richardson-Bullock, James S
- Rhead, Stephen
- Parker, Evan H C
- Whall, Terrance E
- Leadley, David R
Publication details: Science and technology of advanced materials Oct 2012
In:
Science and technology of advanced materials vol. 13
Availability: No items available.
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Unravelling surface and interfacial structures of a metal-organic framework by transmission electron microscopy. [electronic resource] by
- Zhu, Yihan
- Ciston, Jim
- Zheng, Bin
- Miao, Xiaohe
- Czarnik, Cory
- Pan, Yichang
- Sougrat, Rachid
- Lai, Zhiping
- Hsiung, Chia-En
- Yao, Kexin
- Pinnau, Ingo
- Pan, Ming
- Han, Yu
Publication details: Nature materials 05 2017
In:
Nature materials vol. 16
Availability: No items available.
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