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Nanoscale characterization of TiO(2) films grown by atomic layer deposition on RuO(2) electrodes. [electronic resource] by
- Murakami, Katsuhisa
- Rommel, Mathias
- Hudec, Boris
- Rosová, Alica
- Hušeková, Kristína
- Dobročka, Edmund
- Rammula, Raul
- Kasikov, Aarne
- Han, Jeong Hwan
- Lee, Woongkyu
- Song, Seul Ji
- Paskaleva, Albena
- Bauer, Anton J
- Frey, Lothar
- Fröhlich, Karol
- Aarik, Jaan
- Hwang, Cheol Seong
Producer: 20141015
In:
ACS applied materials & interfaces vol. 6
Availability: No items available.
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