Results
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2441.
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2442.
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2444.
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2453.
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2454.
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2455.
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2456.
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Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm. [electronic resource] by
- Dinh, Thanh Hung
- Kondo, Yoshiki
- Tamura, Toshiki
- Ono, Yuichi
- Hara, Hiroyuki
- Oikawa, Hiroki
- Yamamoto, Yoichi
- Ishino, Masahiko
- Nishikino, Masaharu
- Makimura, Tetsuya
- Dunne, Padraig
- O'Sullivan, Gerry
- Ohta, Shigeru
- Kitano, Ken
- Ejima, Takeo
- Hatano, Tadashi
- Higashiguchi, Takeshi
Producer: 20180129
In:
The Review of scientific instruments vol. 87
Availability: No items available.
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2457.
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2458.
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2459.
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