Results
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2301.
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2302.
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2303.
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2304.
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2305.
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2306.
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2307.
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2308.
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2309.
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2310.
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2311.
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2312.
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Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay. [electronic resource] by
- Gong, Zhiliang
- Kerr, Daniel
- Hwang, Hyeondo Luke
- Henderson, J Michael
- Suwatthee, Tiffany
- Slaw, Benjamin R
- Cao, Kathleen D
- Lin, Binhua
- Bu, Wei
- Lee, Ka Yee C
Producer: 20180205
In:
The Review of scientific instruments vol. 88
Availability: No items available.
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2313.
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2314.
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Trace explosives sensor testbed (TESTbed). [electronic resource] by
- Collins, Greg E
- Malito, Michael P
- Tamanaha, Cy R
- Hammond, Mark H
- Giordano, Braden C
- Lubrano, Adam L
- Field, Christopher R
- Rogers, Duane A
- Jeffries, Russell A
- Colton, Richard J
- Rose-Pehrsson, Susan L
Producer: 20180205
In:
The Review of scientific instruments vol. 88
Availability: No items available.
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2315.
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2316.
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A direct electron detector for time-resolved MeV electron microscopy. [electronic resource] by
- Vecchione, T
- Denes, P
- Jobe, R K
- Johnson, I J
- Joseph, J M
- Li, R K
- Perazzo, A
- Shen, X
- Wang, X J
- Weathersby, S P
- Yang, J
- Zhang, D
Producer: 20180205
In:
The Review of scientific instruments vol. 88
Availability: No items available.
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2317.
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2318.
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2319.
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2320.
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