Results
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Extremely thin layer plastification for focused-ion beam scanning electron microscopy: an improved method to study cell surfaces and organelles of cultured cells. [electronic resource] by
- VAN Donselaar, E G
- Dorresteijn, B
- Popov-Čeleketić, D
- VAN DE Wetering, W J
- Verrips, T C
- Boekhout, T
- Schneijdenberg, C T W M
- Xenaki, A T
- VAN DER Krift, T P
- Müller, W H
Producer: 20190815
In:
Journal of microscopy vol. 270
Availability: No items available.
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