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14839.
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Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup. [electronic resource] by
- Ping Wang, Yan
- Letoublon, Antoine
- Nguyen Thanh, Tra
- Bahri, Mounib
- Largeau, Ludovic
- Patriarche, Gilles
- Cornet, Charles
- Bertru, Nicolas
- Le Corre, Alain
- Durand, Olivier
Publication details: Journal of applied crystallography Jun 2015
In:
Journal of applied crystallography vol. 48
Availability: No items available.
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14840.
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