Results
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14481.
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The electrically detected magnetic resonance microscope: combining conductive atomic force microscopy with electrically detected magnetic resonance. [electronic resource] by
- Klein, Konrad
- Hauer, Benedikt
- Stoib, Benedikt
- Trautwein, Markus
- Matich, Sonja
- Huebl, Hans
- Astakhov, Oleksandr
- Finger, Friedhelm
- Bittl, Robert
- Stutzmann, Martin
- Brandt, Martin S
Producer: 20140604
In:
The Review of scientific instruments vol. 84
Availability: No items available.
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14482.
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14483.
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14484.
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14485.
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14486.
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14487.
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14488.
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14489.
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14490.
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14491.
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14492.
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14493.
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14494.
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14495.
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14496.
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14497.
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14498.
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14499.
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14500.
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Ellipsometry with polarisation analysis at cryogenic temperatures inside a vacuum chamber. [electronic resource] by
- Bauer, S
- Grees, B
- Spitzer, D
- Beck, M
- Bottesch, R
- Ortjohann, H-W
- Ostrick, B
- Schäfer, T
- Telle, H H
- Wegmann, A
- Zbořil, M
- Weinheimer, C
Producer: 20140825
In:
The Review of scientific instruments vol. 84
Availability: No items available.
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