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Neutron reflectometry on highly absorbing films and its application to [electronic resource] by
- Piscitelli, F
- Khaplanov, A
- Devishvili, A
- Schmidt, S
- Höglund, C
- Birch, J
- Dennison, A J C
- Gutfreund, P
- Hall-Wilton, R
- Van Esch, P
Publication details: Proceedings. Mathematical, physical, and engineering sciences Jan 2016
In:
Proceedings. Mathematical, physical, and engineering sciences vol. 472
Availability: No items available.
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