Results
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13521.
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13522.
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13523.
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13524.
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13525.
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13526.
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13527.
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13528.
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13529.
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13530.
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13531.
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Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm. [electronic resource] by
- Dinh, Thanh Hung
- Kondo, Yoshiki
- Tamura, Toshiki
- Ono, Yuichi
- Hara, Hiroyuki
- Oikawa, Hiroki
- Yamamoto, Yoichi
- Ishino, Masahiko
- Nishikino, Masaharu
- Makimura, Tetsuya
- Dunne, Padraig
- O'Sullivan, Gerry
- Ohta, Shigeru
- Kitano, Ken
- Ejima, Takeo
- Hatano, Tadashi
- Higashiguchi, Takeshi
Producer: 20180129
In:
The Review of scientific instruments vol. 87
Availability: No items available.
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13532.
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13533.
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13534.
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13535.
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13536.
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13537.
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13538.
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13539.
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13540.
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