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A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source. [electronic resource] by
- Kunz, Martin
- Tamura, Nobumichi
- Chen, Kai
- MacDowell, Alastair A
- Celestre, Richard S
- Church, Matthew M
- Fakra, Sirine
- Domning, Edward E
- Glossinger, James M
- Kirschman, Jonathan L
- Morrison, Gregory Y
- Plate, Dave W
- Smith, Brian V
- Warwick, Tony
- Yashchuk, Valeriy V
- Padmore, Howard A
- Ustundag, Ersan
Producer: 20090610
In:
The Review of scientific instruments vol. 80
Availability: No items available.
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