Results
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10981.
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10982.
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10983.
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10984.
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10985.
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10986.
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Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit. [electronic resource] by
- Rodenhausen, K B
- Kasputis, T
- Pannier, A K
- Gerasimov, J Y
- Lai, R Y
- Solinsky, M
- Tiwald, T E
- Wang, H
- Sarkar, A
- Hofmann, T
- Ianno, N
- Schubert, M
Producer: 20120223
In:
The Review of scientific instruments vol. 82
Availability: No items available.
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10987.
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10988.
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10989.
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10990.
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Time-frequency analysis for microwave reflectometry data processing in the HL-2A tokamak. [electronic resource] by
- Zhong, W L
- Shi, Z B
- Zou, X L
- Ding, X T
- Huang, X L
- Dong, Y B
- Liu, Z T
- Xiao, W W
- Ji, X Q
- Cui, Z Y
- Liu, Yi
- Yan, L W
- Yang, Q W
- Duan, X R
Producer: 20120223
In:
The Review of scientific instruments vol. 82
Availability: No items available.
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10991.
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10992.
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10993.
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10994.
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10995.
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10996.
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10997.
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10998.
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10999.
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11000.
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