X-ray reflectivity and diffuse-scattering study of CoSi2 layers in Si produced by ion-beam synthesis.  [electronic resource] 

 -  Physical review. B, Condensed matter  Feb 1993 
 - 4385-4393 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0163-1829 
<br/><br/><label>Standard No.: </label>10.1103/physrevb.47.4385  doi