TY  - GEN
TI  - Theory of oxide defects near the Si-SiO2 interface
SN  - 0163-1829
PY  - 1990///
PB  - Physical review. B, Condensed matter
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1103/physrevb.41.5061
ER  -