Thin Hf layers in Nb studied by the perturbed angular correlation method. I. Characterization of thin layers in Nb-Hf-Nb layered structures.  [electronic resource] 

 -  Physical review. B, Condensed matter  May 1990 
 - 9790-9793 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0163-1829 
<br/><br/><label>Standard No.: </label>10.1103/physrevb.41.9790  doi