Deep-level-noise spectroscopy of ion-implanted polysilicon thin films.  [electronic resource] 

 -  Physical review. B, Condensed matter  Jul 1988 
 - 1958-1962 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0163-1829 
<br/><br/><label>Standard No.: </label>10.1103/physrevb.38.1958  doi