Wen, S

High resolution electron microscopy investigations of interface and other structure defects in some ceramics. [electronic resource] - Microscopy research and technique Feb 1998 - 177-86 p. digital

Publication Type: Journal Article; Review

1059-910X

10.1002/(SICI)1097-0029(19980201)40:3<177::AID-JEMT2>3.0.CO;2-S doi


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