TY  - GEN
AU  - Strojnik,A
AU  - Sparrow,T G
TI  - An improved scanning system for a high-voltage electron microscope
SN  - 0022-3735
PY  - 1977///0825
KW  - Microscopy, Electron, Scanning
KW  - instrumentation
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1088/0022-3735/10/5/024
ER  -