Kim, G H <br/><br/>
Simple procedure for phase identification using convergent beam electron diffraction patterns.  [electronic resource] 

 -  Microscopy research and technique  Apr 1996 
 - 510-5 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1059-910X 
<br/><br/><label>Standard No.: </label>10.1002/(SICI)1097-0029(19960415)33:6<510::AID-JEMT6>3.0.CO;2-O  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystallization<br/>Image Processing, Computer-Assisted<br/>Microscopy, Electron<br/>X-Ray Diffraction--methods