Link, L F <br/><br/>
Copper thick film sintering studies in an environmental scanning electron microscope.  [electronic resource] 

 -  Microscopy research and technique  Aug 1993 
 - 518-22 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1059-910X 
<br/><br/><label>Standard No.: </label>10.1002/jemt.1070250524  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Conductometry<br/>Copper--chemistry<br/>Microscopy, Electron, Scanning