Najar, S <br/><br/>
EBIC study of electron generation function in a-Si:H.  [electronic resource] 

 -  Microscopy research and technique  Aug 1994 
 - 527-34 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1059-910X 
<br/><br/><label>Standard No.: </label>10.1002/jemt.1070280608  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrons<br/>Microscopy, Electron--methods<br/>Silicon Compounds--chemistry