Pun, T <br/><br/>
Optimized acquisition parameters and statistical detection limit in quantitative EELS.  [electronic resource] 

 -  Journal of microscopy  Sep 1984 
 - 295-316 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, U.S. Gov't, P.H.S. 
<br/><br/><label>ISSN: </label>0022-2720 
<br/><br/><label>Standard No.: </label>10.1111/j.1365-2818.1984.tb02535.x  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron Probe Microanalysis--methods<br/>Statistics as Topic