TY  - GEN
AU  - Kniseley,R N
AU  - Laabs,F C
AU  - Van Zuuk,D
TI  - Improved electron beam scanning system for electron microprobe x-ray analyzers
SN  - 0034-6748
PY  - 1969///0109
KW  - Electron Probe Microanalysis
KW  - Electrons
KW  - Spectrum Analysis
KW  - instrumentation
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1063/1.1683243
ER  -