Sickafus, E N <br/><br/>
A secondary emission analog for improved auger spectroscopy with retarding potential analyzers.  [electronic resource] 

 -  The Review of scientific instruments  Jul 1971 
 - 933-41 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0034-6748 
<br/><br/><label>Standard No.: </label>10.1063/1.1685310  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron Probe Microanalysis<br/>Electrons<br/>Mathematics<br/>Methods<br/>Spectrum Analysis