TY  - GEN
AU  - Kruit,P
AU  - Shuman,H
TI  - The influence of objective lens aberrations in energy-loss spectrometry
SN  - 0304-3991
PY  - 1986///0312
KW  - Electron Probe Microanalysis
KW  - instrumentation
KW  - Lenses
KW  - Mathematics
KW  - Microscopy, Electron
N1  - Publication Type: Journal Article; Research Support, U.S. Gov't, P.H.S
UR  - https://doi.org/10.1016/0304-3991(85)90093-2
ER  -