Cronin, James T <br/><br/>
Modeling the effects of density dependent emigration, weak Allee effects, and matrix hostility on patch-level population persistence.  [electronic resource] 

 -  Mathematical biosciences and engineering : MBE  12 2019 
 - 1718-1742 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1551-0018 
<br/><br/><label>Standard No.: </label>10.3934/mbe.2020090  doi