Bhadauriya, Sonal <br/><br/>
Nanoscale Pattern Decay Monitored Line by Line via In Situ Heated Atomic Force Microscopy.  [electronic resource] 

 -  ACS applied materials & interfaces  Apr 2020 
 - 15943-15950 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1944-8252 
<br/><br/><label>Standard No.: </label>10.1021/acsami.0c01807  doi