TY  - GEN
AU  - Skoupy,Radim
AU  - Fort,Tomas
AU  - Krzyzanek,Vladislav
TI  - Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration
SN  - 2079-4991
PY  - 2020///
PB  - Nanomaterials (Basel, Switzerland)
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.3390/nano10020332
ER  -