Skoupy, Radim <br/><br/>
Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration.  [electronic resource] 

 -  Nanomaterials (Basel, Switzerland)  Feb 2020 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>2079-4991 
<br/><br/><label>Standard No.: </label>10.3390/nano10020332  doi