TY  - GEN
AU  - Kim,Zin-Sig
AU  - Lee,Hyung Seok
AU  - Bae,Sung-Bum
AU  - Nam,Eun Soo
AU  - Lim,Jong-Won
TI  - Effects of Recess Depth Under the Gate Area on the 
SN  - 1533-4899
PY  - 2020///
PB  - Journal of nanoscience and nanotechnology
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1166/jnn.2020.17783
ER  -