TY  - GEN
AU  - Hunter,Katharine I
AU  - Bedford,Nicholas
AU  - Schramke,Katelyn
AU  - Kortshagen,Uwe R
TI  - Probing Dopant Locations in Silicon Nanocrystals via High Energy X-ray Diffraction and Reverse Monte Carlo Simulation
SN  - 1530-6992
PY  - 2020///
PB  - Nano letters
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1021/acs.nanolett.9b03025
ER  -