Hunter, Katharine I <br/><br/>
Probing Dopant Locations in Silicon Nanocrystals via High Energy X-ray Diffraction and Reverse Monte Carlo Simulation.  [electronic resource] 

 -  Nano letters  Feb 2020 
 - 852-859 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1530-6992 
<br/><br/><label>Standard No.: </label>10.1021/acs.nanolett.9b03025  doi