Lee, Hojin <br/><br/>
Passivation of Deep-Level Defects by Cesium Fluoride Post-Deposition Treatment for Improved Device Performance of Cu(In,Ga)Se  [electronic resource] 

 -  ACS applied materials & interfaces  Oct 2019 
 - 35653-35660 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1944-8252 
<br/><br/><label>Standard No.: </label>10.1021/acsami.9b08316  doi