Degler, David <br/><br/>
Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials.  [electronic resource] 

 -  ACS sensors  09 2019 
 - 2228-2249 p.  digital 
<br/><br/> Publication Type: Journal Article; Review 
<br/><br/><label>ISSN: </label>2379-3694 
<br/><br/><label>Standard No.: </label>10.1021/acssensors.9b00975  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Chemistry Techniques, Analytical--instrumentation<br/>Gases--analysis<br/>Metals--chemistry<br/>Oxides--chemistry<br/>Semiconductors