TY  - GEN
AU  - Chen,Zhe
AU  - Luo,Jiawei
AU  - Doudevski,Ivo
AU  - Erten,Sema
AU  - Kim,Seong H
TI  - Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip
SN  - 1435-8115
PY  - 0000///102019///
PB  - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
N1  - Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S
UR  - https://doi.org/10.1017/S1431927619014697
ER  -