Chen, Zhe <br/><br/>
Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  10 2019 
 - 1106-1111 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>1435-8115 
<br/><br/><label>Standard No.: </label>10.1017/S1431927619014697  doi