Park, Do-Hyun <br/><br/>
The evolution of surface cleanness and electronic properties of graphene field-effect transistors during mechanical cleaning with atomic force microscopy.  [electronic resource] 

 -  Nanotechnology  Sep 2019 
 - 394003 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/1361-6528/ab2cf6  doi