TY  - GEN
AU  - Shin,Hyun Wook
AU  - Son,Jong Yeog
TI  - A conducting atomic force microscopy study of conducting filament nanobits in the epitaxial NiO thin film prepared precisely controlled by the oxidation time of the single crystalline Ni substrates
SN  - 1879-2723
PY  - 2019///
PB  - Ultramicroscopy
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1016/j.ultramic.2019.05.009
ER  -